The government requires One (1) Power Semiconductor Analyzer that meets the following requirements:
1) The contractor shall provide one (1) Power Semiconductor Analyzer, also referred to as a benchtop system or curve tracer, which can measure electrical current and voltage characteristics of electronic devices.
2) The System must utilize source-measure units (SMUs), simultaneously measuring both voltage and electrical current while sourcing either voltage or electrical current.
3) The System shall be configured for Kelvin sensing.
4) The System shall be configured with no less than one (1) SMU with maximum ranges of no less than 25 Volts (V) and 100 milliampere (mA) in Direct Current (DC) mode and capable of a higher current in a pulsed mode.
a. Voltage source/measure resolution shall be less than 100 parts per million (ppm), with a lowest-range resolution of no greater than ten (10) microvolts (μV).
b. Current source/measure resolution must be less than 100 ppm, with a lowest-range resolution of no greater than one (1) nanoamp (nA).
5) The contractor shall provide all supplies required for initial configuration.
6) The contractor shall provide software for controlling the instrument that applies to a wide variety of standardized tests, along with user-defined test sequences.
a. The contractor shall also include stress-and-measure testing software, and shall have the ability to automate testing whether through built-in software or 3rd party instrument drivers.
7) The System must allow for data export through universally available formats (e.g., comma-separated values CSV) that can be read by commonly used software (e.g., Microsoft Excel).
8) The System must support interface to an external computer through at least one of either Universal Serial Bus (USB) or General Purpose Interface Bus (GPIB) interfaces to allow for instrument control and data transfer.
9) The System must be able to export data onto a USB mass storage device (e.g., flash drive or external hard disk).
10) The System must be expandable to voltage source and measurement maximum range capabilities of no less than ten (10) kilovolts (kV) needed for evaluating the blocking ability of ultra-wide bandgap semiconductor devices.
a. The voltage measurement resolution under this range must be less than one (1) V, and minimum current measurement resolution less than one (1) nA.
11) The System shall be expandable to current source and measurement maximum range capabilities of no less than 1,000 amps (A) needed for evaluating on-state characteristics of ultra-wide bandgap semiconductor devices intended for high power applications.
a. The current measurement resolution under this range must be less than 100 mA, and minimum voltage measurement resolution less than ten (10) millivolts (mV).